• DocumentCode
    1096926
  • Title

    Temperature dependence of the relaxation decay time and the integrated intensity of the photoluminescence from the magnetic semiconductor CdCr2Se4

  • Author

    Yao, S.S. ; Alfano, Robert R. ; Miniscalco, William J.

  • Author_Institution
    City College of New York, NY, USA
  • Volume
    19
  • Issue
    4
  • fYear
    1983
  • fDate
    4/1/1983 12:00:00 AM
  • Firstpage
    711
  • Lastpage
    713
  • Abstract
    The photoluminescence relaxation decay time of the band-to-band transition in CdCr2Se4was measured from 4 to 250 K. The decay time was measured to be ∼ 45 ps at 4 K, which monotonically decreased to < 10 ps at 250 K. The integrated intensity of the steady-state photoluminescence from CdCr2Se4was measured from 15 to 220 K. The steady-state intensity increased as the temperature decreased, and increased quadratically with the excitation intensity. The temperature dependence of the relaxation decay time is theoretically fitted to the temperature dependence of the steady-state integrated intensity.
  • Keywords
    Cadmium materials/devices; Magnetic semiconductor materials/devices; Photoluminescent materials/devices; Relaxation processes; Semiconductor device thermal factors; Laser excitation; Luminescence; Magnetic semiconductors; Photoluminescence; Pulse amplifiers; Steady-state; Switches; Temperature dependence; Time measurement; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1983.1071919
  • Filename
    1071919