• DocumentCode
    1097045
  • Title

    GaAs/(Ga,Al)As heterojunction bipolar transistors with buried oxygen-implanted isolation layers

  • Author

    Asbeck, P.M. ; Miller, D.L. ; Anderson, R.J. ; Eisen, F.H.

  • Author_Institution
    Rockwell International, Thousand Oaks, CA
  • Volume
    5
  • Issue
    8
  • fYear
    1984
  • fDate
    8/1/1984 12:00:00 AM
  • Firstpage
    310
  • Lastpage
    312
  • Abstract
    A simple self-aligned technique using oxygen implants to reduce the extrinsic base-collector capacitance in GaAs/(Ga,Al)As heterojunction bipolar transistors (HBT´s) is described. This technique has been used to achieve nonthreshold logic ring-oscillators with propagation delays down to 30 ps per gate, the lowest reported to date for any bipolar transistor circuit.
  • Keywords
    Annealing; Boron alloys; Capacitance; Diodes; Etching; Fabrication; Gallium arsenide; Heterojunction bipolar transistors; Implants; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25927
  • Filename
    1484303