Title :
Measurement of laser photoelectron image degradation at high current densities
Author_Institution :
Electronics Systems Group, Western Division, Electro-Optics Organizations, GTE Sylvania, Inc., Mountain View, CA
fDate :
5/1/1983 12:00:00 AM
Abstract :
Loss of image resolution and contrast in a laser-illuminated photoelectron microscope have been measured for current densities up to 1 A/cm2and light intensities up to about 2 MW/cm2. Contrast is greatly reduced at these levels for detail less than a few microns in size, although images below 0.1 A/cm2contain 0.1 μm detail. Comparison to theory shows that the aberrations are larger than predicted.
Keywords :
Laser applications, measurement; Microscopy; Photoemitting materials/devices; Current density; Current measurement; Degradation; Density measurement; Electron optics; Laser beams; Nonlinear optics; Optical surface waves; Optical waveguides; Photoelectron microscopy;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1983.1071948