Title :
Extended measurements of gallium arsenide breakdown characteristics using punchthrough structures
Author :
Baliga, B.J. ; Sears, A.R. ; Menditto, P. ; Campbell, P.M.
Author_Institution :
General Electric Company, Schenectady, NY
fDate :
9/1/1984 12:00:00 AM
Abstract :
Measurements of the avalanche breakdown characteristics of gallium arsenide have been extended to carrier concentrations below 1015per cm3by using punchthrough structures. Although the earlier measured values [7] at doping levels above 1015per cm3were in close agreement with the theoretical calculations by Lee and Sze [6], the measurements performed in this study at lower doping indicate an overestimation of the breakdown voltage by about 30 percent by the theoretical analysis.
Keywords :
Atomic measurements; Avalanche breakdown; Breakdown voltage; Doping; Electric breakdown; Epitaxial growth; Epitaxial layers; Gallium arsenide; Schottky diodes; Substrates;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1984.25955