DocumentCode :
1097332
Title :
A Background Sample-Time Error Calibration Technique Using Random Data for Wide-Band High-Resolution Time-Interleaved ADCs
Author :
Haftbaradaran, Afshin ; Martin, Kenneth W.
Author_Institution :
Univ. of Toronto, Toronto
Volume :
55
Issue :
3
fYear :
2008
fDate :
3/1/2008 12:00:00 AM
Firstpage :
234
Lastpage :
238
Abstract :
Sample-time error among the channels of a time-interleaved analog-to-digital converter (ADC) is the main reason for significant degradation of the effective resolution of the high-speed time-interleaved ADC. A calibration technique for sample-time mismatches has been proposed and implemented at a low level of complexity. The calibration method uses random data and is especially suitable for ADCs used in digital data communication systems. An 800-MS/s four-channel, time-interleaved ADC system has been implemented to evaluate the performance of the technique. The experimental results show that the spurious-free dynamic range of the ADC system is improved to 58.1 dB at 350 MHz. The ADC system achieves a signal-to-noise and distortion ratio of 59.6 dB at 5 MHz and 50.1 dB at 350 MHz after calibration.
Keywords :
analogue-digital conversion; calibration; analog-to-digital converter; background sample-time error calibration; digital data communication; frequency 350 MHz; frequency 5 MHz; noise figure 50.1 dB; noise figure 58.1 dB; noise figure 59.6 dB; random data; sample-time mismatches; signal-to-noise ratio; wide-band high-resolution time-interleaved ADC; Analog-to-digital converter (ADC); calibration; sample-time mismatch; skew; time interleaved;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2008.918970
Filename :
4469987
Link To Document :
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