• DocumentCode
    1097332
  • Title

    A Background Sample-Time Error Calibration Technique Using Random Data for Wide-Band High-Resolution Time-Interleaved ADCs

  • Author

    Haftbaradaran, Afshin ; Martin, Kenneth W.

  • Author_Institution
    Univ. of Toronto, Toronto
  • Volume
    55
  • Issue
    3
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    234
  • Lastpage
    238
  • Abstract
    Sample-time error among the channels of a time-interleaved analog-to-digital converter (ADC) is the main reason for significant degradation of the effective resolution of the high-speed time-interleaved ADC. A calibration technique for sample-time mismatches has been proposed and implemented at a low level of complexity. The calibration method uses random data and is especially suitable for ADCs used in digital data communication systems. An 800-MS/s four-channel, time-interleaved ADC system has been implemented to evaluate the performance of the technique. The experimental results show that the spurious-free dynamic range of the ADC system is improved to 58.1 dB at 350 MHz. The ADC system achieves a signal-to-noise and distortion ratio of 59.6 dB at 5 MHz and 50.1 dB at 350 MHz after calibration.
  • Keywords
    analogue-digital conversion; calibration; analog-to-digital converter; background sample-time error calibration; digital data communication; frequency 350 MHz; frequency 5 MHz; noise figure 50.1 dB; noise figure 58.1 dB; noise figure 59.6 dB; random data; sample-time mismatches; signal-to-noise ratio; wide-band high-resolution time-interleaved ADC; Analog-to-digital converter (ADC); calibration; sample-time mismatch; skew; time interleaved;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2008.918970
  • Filename
    4469987