DocumentCode
1097602
Title
Modulation detuning characteristics of actively mode-locked diode lasers
Author
Goodwin, John C. ; Garside, B.K.
Author_Institution
McMaster Univ., Hamilton, Ontario, Canada
Volume
19
Issue
6
fYear
1983
fDate
6/1/1983 12:00:00 AM
Firstpage
1068
Lastpage
1073
Abstract
Existing frequency domain models for the active mode locking of diode lasers are appropriate for antireflection- (AR-) coated devices. This paper presents the first frequency domain model for non-AR-coated devices. The use of uncoated devices permits the independent measurement of all of the important laser parameters required for the model, so that no adjustable parameters are needed. An additional novel feature of this model is that the effect of gain saturation on the exact shape of the gain waveform is allowed for in a completely self-consistent fashion. Experimental studies were carried out on uncoated undegraded commerical laser diodes. Threshold reductions of 25-30 percent were achieved for external cavity operation. The mode-locking studies reported in this paper were carried out above the external threshold current, with a sinusoidal modulation near 1 GHz at a modulation index of 4 percent. The results of these studies showed good agreement with the predictions of the model presented here, in contrast with the predictions of the existing models. Specifically, the modulation frequency corresponding to the shortest most intense mode-locked pulses was found to occur at a fraction of 1 percent below the frequency matched to the external cavity roundtrip time. As well, the predicted effects of gain saturation were observed in the detailed structure of the mode-locked pulses, and in their detuning characteristics.
Keywords
Mode locked lasers; Semiconductor lasers; Diode lasers; Frequency domain analysis; Frequency modulation; Laser cavity resonators; Laser mode locking; Optical pulses; Predictive models; Pulse modulation; Pulse width modulation; Shape;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1983.1071990
Filename
1071990
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