Title :
Reply to "Comments on \´source-and-drain series resistance of LDD MOSFET\´s\´"
Author :
Sheu, B.J. ; Hu, C. ; Ko, P.K. ; Hsu, F.-C.
Author_Institution :
University of California, Berkeley, CA
Keywords :
Electric resistance; Electrical resistance measurement; Error correction; Intrusion detection; Labeling; Laboratories; Length measurement; MOSFET circuits; Monitoring; Physics;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1984.26016
