Title :
A Statistical Method to Extract MBU Without Scrambling Information
Author :
Falguére, Didier ; Petit, Sophie
Author_Institution :
ONERA-DESP, Toulouse
Abstract :
This paper reports on a new method for extracting MBUs from standard SEE data without the need for the physical organisation of the memories. Efficiency of the method proposed here is quantified through a reduced set of parameters.
Keywords :
SRAM chips; statistical analysis; SRAM; multiple bit upset; statistical method; Data mining; Error correction codes; Helium; Laser theory; Protons; Random access memory; Reverse engineering; Single event upset; Statistical analysis; Testing; Multiple bit upset (MBU); SRAM; single event upset (SEU);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.903178
