• DocumentCode
    1098282
  • Title

    Simulation of Photoelectric Transport in High-Resistivity CdTe for X-Ray Detectors

  • Author

    Franc, J. ; Grill, R. ; Kubát, J. ; Belas, E. ; Moravec, P. ; Höschl, P.

  • Author_Institution
    Fac. of Math. & Phys., Charles Univ., Prague, Czech Republic
  • Volume
    54
  • Issue
    4
  • fYear
    2007
  • Firstpage
    864
  • Lastpage
    867
  • Abstract
    Photoelectric transport in high resistivity CdTe at room temperature was numerically simulated based on the self-consistent steady state solution of coupled drift-diffusion equations and the Poisson equation of the photo-excited electron-hole system. Relative influence of recombination and space charge induced distortion of electric field on the reduction of charge collection efficiency was investigated. It was shown that space charge effects play significant role, if concentration of deep levels exceeds 1013 cm-3 at typical values of carriers´ capture cross-section. Possibility to reduce the screening effects decreasing a detector thickness to a minimum value guaranteeing full absorption of incident X-ray radiation was investigated.
  • Keywords
    Poisson equation; X-ray detection; deep levels; diffusion; electron-hole recombination; photoconductivity; semiconductor counters; space charge; Poisson equation; X-ray detectors; absorption; carriers capture cross-section; charge collection efficiency; coupled drift-diffusion equation; deep levels; high-resistivity CdTe; incident X-ray radiation; photoelectric transport; photoexcited electron-hole system; recombination; room temperature; screening effects; self-consistent steady state solution; space charge induced distortion; temperature 293 K to 298 K; Conductivity; Numerical simulation; Poisson equations; Radiation detectors; Space charge; Spontaneous emission; Steady-state; Temperature; X-ray detection; X-ray detectors; CdTe; photoelectric; polarization; semiinsulating;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2007.895506
  • Filename
    4291728