DocumentCode
1098282
Title
Simulation of Photoelectric Transport in High-Resistivity CdTe for X-Ray Detectors
Author
Franc, J. ; Grill, R. ; Kubát, J. ; Belas, E. ; Moravec, P. ; Höschl, P.
Author_Institution
Fac. of Math. & Phys., Charles Univ., Prague, Czech Republic
Volume
54
Issue
4
fYear
2007
Firstpage
864
Lastpage
867
Abstract
Photoelectric transport in high resistivity CdTe at room temperature was numerically simulated based on the self-consistent steady state solution of coupled drift-diffusion equations and the Poisson equation of the photo-excited electron-hole system. Relative influence of recombination and space charge induced distortion of electric field on the reduction of charge collection efficiency was investigated. It was shown that space charge effects play significant role, if concentration of deep levels exceeds 1013 cm-3 at typical values of carriers´ capture cross-section. Possibility to reduce the screening effects decreasing a detector thickness to a minimum value guaranteeing full absorption of incident X-ray radiation was investigated.
Keywords
Poisson equation; X-ray detection; deep levels; diffusion; electron-hole recombination; photoconductivity; semiconductor counters; space charge; Poisson equation; X-ray detectors; absorption; carriers capture cross-section; charge collection efficiency; coupled drift-diffusion equation; deep levels; high-resistivity CdTe; incident X-ray radiation; photoelectric transport; photoexcited electron-hole system; recombination; room temperature; screening effects; self-consistent steady state solution; space charge induced distortion; temperature 293 K to 298 K; Conductivity; Numerical simulation; Poisson equations; Radiation detectors; Space charge; Spontaneous emission; Steady-state; Temperature; X-ray detection; X-ray detectors; CdTe; photoelectric; polarization; semiinsulating;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2007.895506
Filename
4291728
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