DocumentCode :
1098351
Title :
A high aspect ratio design approach to millimeter-wave HEMT structures
Author :
Das, Mukunda B.
Author_Institution :
Pennsylvania State University, University Park, PA
Volume :
32
Issue :
1
fYear :
1985
fDate :
1/1/1985 12:00:00 AM
Firstpage :
11
Lastpage :
17
Abstract :
In MESFET and HEMT structures as the gate length is reduced below 0.5 µm in an attempt to achieve amplification at highest possible frequencies, it is essential that the depletion depth under the gate be also reduced in order to preserve a high aspect ratio that ensures a high device voltage gain factor (gm/g0) and a reasonable value of stable power gain at high frequencies. Results based on this design approach indicate that an n-A1GaAs/GaAs HEMT structure with 0.25-µm gate length could provide stable power gain in excess of 6 dB at the unity current gain frequency of 92.4 GHz, and for an aspect ratio of ten it is difficult to reduce the gate length below 0.25 µm.
Keywords :
Contact resistance; Electron devices; Frequency conversion; Gallium arsenide; HEMTs; Heterojunctions; MESFETs; Microwave devices; Millimeter wave transistors; Ring oscillators;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.21902
Filename :
1484649
Link To Document :
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