DocumentCode
1098398
Title
Economic effects in design and test
Author
Dear, I.D. ; Dislis, C. ; Ambler, A.P. ; Dick, J.
Author_Institution
Brunel Univ., Uxbridge, UK
Volume
8
Issue
4
fYear
1991
Firstpage
64
Lastpage
77
Abstract
The authors argue that because of misconceptions and myths about the cost of test, many devices and systems are inadequately tested. Focusing on application-specific integrated circuits (ASICs), the authors discuss the economics of test and show how economic analysis leads to test that pays back. The EVEREST test strategy planner, a design tool that aids in the selection of design-for-testability structures during ASIC design and uses cost as a primary selection parameter, is presented.<>
Keywords
application specific integrated circuits; automatic testing; economics; electrical engineering computing; integrated circuit testing; application-specific integrated circuits; design; design tool; design-for-testability; economic effects; test; Books; Central Processing Unit; Circuit faults; Circuit testing; Costs; Degradation; Electronic circuits; Electronic equipment testing; Integrated circuit testing; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.107206
Filename
107206
Link To Document