Total Dose and Single Event Transients in Linear Voltage Regulators

Author

Kelly, Andrew T. ; Adell, Philippe C. ; Witulski, Arthur F. ; Holman, W. Timothy ; Schrimpf, Ronald D. ; Pouget, Vincent

Author_Institution

Vanderbilt Univ., Nashville

Volume

54

Issue

4

fYear

2007

Firstpage

1327

Lastpage

1334

Abstract

Radiation effects on four common DC linear voltage regulators are investigated. Increasing total dose is shown to degrade converter regulation by degrading the loop gain and phase response. Regulator single event transient (SET) response is characterized, and a mitigation technique is proposed. Shunt regulator topologies are found to be superior to series regulator topologies in terms of radiation tolerance.

Keywords

bipolar transistors; dosimetry; frequency response; nuclear electronics; radiation effects; voltage regulators; NPN pass transistors; PNP pass transistors; converter regulation; linear voltage regulators; loop gain; mitigation technique; phase response; radiation effects; radiation tolerance; series regulator topologies; shunt regulator topologies; single event transients; total dose; Circuit topology; Degradation; Driver circuits; Feedback circuits; Feedback loop; Operational amplifiers; Regulators; Resistors; Sampling methods; Voltage control; Frequency response; linear voltage regulator; single event transient (SET); total ionizing dose;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2007.903243

Filename

4291742