Title :
Index distribution of optical waveguides from their mode profile
Author :
McCaughan, Leon ; Bergmann, Ernest E.
Author_Institution :
Bell Labs., Allentown, PA, USA
fDate :
3/1/1983 12:00:00 AM
Abstract :
The refractive-index profile is readily calculated from the observed fundamental mode pattern using the scalar-wave equation. Index distributions of diffused Ti: LiNbO3waveguides were measured and are consistent with model calculations.
Keywords :
Lithium materials/devices; Optical refraction; Optical waveguides; Electrooptic devices; Electrooptical waveguides; Laplace equations; Optical device fabrication; Optical refraction; Optical sensors; Optical waveguides; Shape measurement; Strips; Wavelength measurement;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.1983.1072065
