Title :
Phase-locked arrays of antiguides: analytical theory
Author :
Botez, Dan ; Napartovich, Anatolii P.
Author_Institution :
Dept. of Electr. Eng., Wisconsin Univ., Madison, WI, USA
fDate :
4/1/1994 12:00:00 AM
Abstract :
By employing a variational technique on the eigenvalue equation for finite arrays of antiguides we obtain accurate analytical expressions for key parameters characterizing the resonant array modes: the radiation loss at resonance, αRR, and the propagation constant at resonance. The previously empirical finding that αRR is equal to the radiation loss of a single antiguide divided by the number of array elements is found to be a good approximation only for large element/interelement width ratios (⩾3) and for, high-index-step (Δn⩾0.05) devices. By using an expansion, the radiation loss versus index-step curve is well approximated near resonance by a parabola, which gives curve halfwidths at half intensity only 10 to 15% less than numerically calculated values. An extremely accurate approximation formula is obtained for the resonant-mode propagation constant over large ranges in index-step variation around the resonance point. The obtained formulae are discussed in light of device design
Keywords :
eigenvalues and eigenfunctions; laser mode locking; laser theory; optical losses; optical waveguide theory; refractive index; semiconductor laser arrays; variational techniques; analytical expressions; analytical theory; antiguide arrays; approximation formula; array elements; device design; eigenvalue equation; element width ratios; finite arrays; high-index-step; index-step variation; interelement width ratios; phase-locked arrays; propagation constant; radiation loss; resonance; resonance point; resonant array modes; resonant-mode propagation constant; semiconductor laser arrays; variational technique; Diffraction; Equations; Laser beams; Optical arrays; Phased arrays; Propagation constant; Propagation losses; Pulse amplifiers; Resonance; Semiconductor laser arrays;
Journal_Title :
Quantum Electronics, IEEE Journal of