Title :
Effects of Backfilling on Cable Ampacity Analyzed With the Finite Element Method
Author :
De León, Francisco ; Anders, George J.
Author_Institution :
Polytech. Univ., Brooklyn
fDate :
4/1/2008 12:00:00 AM
Abstract :
Expressions for computing the external thermal resistance (T4) of buried cables, in both the IEEE and the IEC standards, are applicable to a limited number of installation geometries. In this paper, a method for the computation of T4 using the finite element approach is presented. With this method, a parametric study on how cable ampacity is affected by different configurations of the backfills is performed. The obtained results are compared with those of the IEC and IEEE standards (Neher-McGrath) and published extensions by El-Kady and Horrocks. Important differences can be observed for nonstandardized situations.
Keywords :
IEC standards; IEEE standards; finite element analysis; power cables; thermal resistance; underground cables; IEC standards; IEEE standards; backfilling effect; buried cables; cable ampacity; external thermal resistance; finite element method; Ampacity; Neher–McGrath; backfill; cable thermal rating; external thermal resistance; finite element method; underground cables;
Journal_Title :
Power Delivery, IEEE Transactions on
DOI :
10.1109/TPWRD.2008.917648
