• DocumentCode
    1098729
  • Title

    An advanced bipolar-MOS-I2L technology with a thin epitaxial layer for analog-digital VLSI

  • Author

    Okada, Yutaka ; Kaneko, Kenji ; Kudo, Satoshi ; Yamazaki, Kouichi ; Okabe, Takahiro

  • Author_Institution
    Hitachi Ltd., Tokyo, Japan
  • Volume
    32
  • Issue
    2
  • fYear
    1985
  • fDate
    2/1/1985 12:00:00 AM
  • Firstpage
    232
  • Lastpage
    236
  • Abstract
    A novel Bi-MOS technology, Advanced Bipolar CMOS (ABC), is proposed. Bipolar transistors (n-p-n, p-n-p, I2L) and MOS transistors (both n- and p-channel) have been successfully fabricated on the same chip with no decrease in performance by using a 3-µm design rule. Thin epitaxial layer ( \\leq 2 \\\\mu m) is used in order to obtain small-size high-performance (3-GHz) bipolar devices. Device size is reduced by using a shallow junction and self-aligning technique. n-channel MOS transistors are formed in p-well regions designed to reach p-type substrate, and p-channel MOS transistors are formed in epitaxial layer with an n+buried layer. This technology has the potential for monolithic multifunctional analog-digital VLSI.
  • Keywords
    Analog circuits; Analog-digital conversion; Bipolar transistors; CMOS process; CMOS technology; Epitaxial layers; MOS devices; MOSFETs; Substrates; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.21934
  • Filename
    1484681