Title :
Low-Frequency Shielding Resonance
Author :
Schulz, Richard B. ; Plantz, Vellar C. ; Brush, David R.
Author_Institution :
Boeing Company, Renton, Wash. 98055
fDate :
3/1/1968 12:00:00 AM
Abstract :
A low-frequency resonance in the 5- to 200-kHz range has been discovered in typical shielding enclosures. It is due to unequal phase shifts in wave transmission to a receiving point via two or more parallel paths: one through the shielding material itself and others through leakage paths such as seams. Theoretical and experimental results are shown to be in close agreement and indicate a new approach to the design of shielding enclosures.
Keywords :
Brushes; Conductivity; Contracts; Electromagnetic shielding; Frequency; Impedance; Magnetic materials; Permeability; Reflection; Resonance;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.1968.302901
