DocumentCode :
1098892
Title :
On-line monitoring technique of the refractive-index profile in the VAD process
Author :
Chida, Kazunori ; Nakahara, Motohiro ; Sudo, Shoichi ; Inagaki, Nobuo
Author_Institution :
Nippon Telegraph and Telephone Public Corp., Ibaraki-ken, Japan
Volume :
1
Issue :
1
fYear :
1983
fDate :
3/1/1983 12:00:00 AM
Firstpage :
56
Lastpage :
60
Abstract :
A nondestructive on-line monitoring method to estimate the refractive-index profile in vapor-phase axial deposition (VAD) processing has been developed. This technique is developed on the basis of the deposition properties of a SiO2 -GeO2 glass particles in the flame hydrolysis reaction. The profile monitoring accuracy is 
in refractive-index difference. The estimated profiles during the porous preform fabrication are well coincided with those of the consolidated preform. The average bandwidth properties of graded-index fibers produced by adjusting the fabrication conditions, to be optimized with using present method, is 2.5 GHz . km0.9at 1.3-μm wavelength.
in refractive-index difference. The estimated profiles during the porous preform fabrication are well coincided with those of the consolidated preform. The average bandwidth properties of graded-index fibers produced by adjusting the fabrication conditions, to be optimized with using present method, is 2.5 GHz . km0.9at 1.3-μm wavelength.Keywords :
Infrared refraction; Optical fiber materials/fabrication; Optical fiber measurements; Bandwidth; Fabrication; Glass; Monitoring; Optical fiber communication; Optical fibers; Optical refraction; Preforms; Telegraphy; Telephony;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.1983.1072106
Filename :
1072106
Link To Document :
