DocumentCode :
1099097
Title :
A 10K-gate CMOS gate array based on a gate isolation structure
Author :
Sakashita, Kazuhiro ; Ueda, Masahiro ; Arakawa, Takahiko ; Asai, Sotoju ; Fujimura, Tatsuo ; Ohkura, Isao
Author_Institution :
Mitsubishi Electric Corporation, Itami, Japan
Volume :
32
Issue :
2
fYear :
1985
fDate :
2/1/1985 12:00:00 AM
Firstpage :
493
Lastpage :
497
Abstract :
This paper describes an effect of the "gate isolation" technique and its application to a 10K-gate CMOS gate-array VLSI chip. This gate array is fabricated using a 2-µm n-well CMOS technology, with double-level metallization. As an example, a 32-bit parallel array multiplier is designed using a fully automatic CAD System. The density of CMOS gate arrays using gate isolation is estimated to be 1.10 to 1.26 times greater than that of the arrays using several types of oxide isolation, when implementing circuits with complexities on the order of 10K gates.
Keywords :
Aluminum; CMOS logic circuits; CMOS technology; Design automation; Isolation technology; Large scale integration; Logic arrays; Metallization; Very large scale integration; Wiring;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.21968
Filename :
1484715
Link To Document :
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