DocumentCode :
1099368
Title :
Influence of electrode and insulator materials on the neutron emission in a low energy plasma focus device
Author :
Rout, R.K. ; Garg, A.B. ; Shyam, A. ; Srinivasan, M.
Author_Institution :
Div. of Neutron Phys., Bhabha Atomic Res. Centre, Bombay, India
Volume :
23
Issue :
6
fYear :
1995
fDate :
12/1/1995 12:00:00 AM
Firstpage :
996
Lastpage :
1000
Abstract :
Insertion of internal impurities is one of the factors for the degradation of neutron output in plasma focus devices. In this context, neutron emission measurements were carried out in a 2.2 kJ (7.2 μF, 25 kV) Mather type squirrel cage plasma focus device with various combinations of electrode and insulator materials. The neutron yield was measured by silver activation detector. The results indicate that a central electrode of low erosion rate material produces maximum neutron yield with the highest anisotropy factor. A time integrated X-ray pinhole image shows that focus corresponding to the highest neutron yield material is the most compressed. The dielectric constant of the ceramic insulators has, at best, a very weak correlation with neutron output. The nonceramic insulators like perspex, nylon, or teflon neither produce focus nor neutrons
Keywords :
electrodes; neutron sources; plasma diagnostics; plasma focus; plasma impurities; 2.2 kJ; 25 kV; 7.2 muF; Ag activation detector; Mather type squirrel cage plasma focus device; ceramic insulators; dielectric constant; electrode; insulator materials; internal impurities; low energy plasma focus device; neutron emission; neutron output; neutron yield; nonceramic insulators; nylon; perspex; teflon; time integrated X-ray pinhole image; Degradation; Dielectric materials; Dielectrics and electrical insulation; Electrodes; Focusing; Impurities; Neutrons; Plasma devices; Plasma materials processing; Plasma measurements;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.476488
Filename :
476488
Link To Document :
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