• DocumentCode
    1099400
  • Title

    Optical single layer lift-off process

  • Author

    Moritz, Holger

  • Author_Institution
    IBM Laboratories, Boeblingen, Germany
  • Volume
    32
  • Issue
    3
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    672
  • Lastpage
    676
  • Abstract
    The lithography of the metal wiring layers is becoming the most confining technology in the era of VLSI (very large-scale integration), as more and more circuits have to be wired on the chip itself. The two competing technologies are subtractive etch (wet or dry), and additive metal lift-off. As lift-off needs no etching, it inherently offers cost and density advantages. It, however, requires an undercut photoresist profile. These undercuts can be achieved with an image-reversal process. The paper describes such a reversal process, especially tuned for lift-off applications. The result is a simple single-layer lift-off technology with excellent image quality.
  • Keywords
    Circuits; Costs; Dry etching; Image quality; Large scale integration; Lithography; Resists; Very large scale integration; Wet etching; Wiring;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.21997
  • Filename
    1484743