DocumentCode :
1099460
Title :
A high short-circuit current inversion layer poly-Si solar cell
Author :
Chang, C.Y. ; Fang, Y.K. ; Wu, B.S.
Author_Institution :
National Cheng Kung University Tainan, Taiwan, Republic of China
Volume :
32
Issue :
3
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
712
Lastpage :
713
Abstract :
An IL/MIS poly-Si solar cell is fabricated. Its short-circuit current reveals a very high value of 32.8 mA/cm2. During fabrication, the front side of poly-Si wafer has to be polished for 2 min to obtain a mirror-like surface. The thin oxide was grown at 400°C in N2/O2ambient, and SiO film was evaporated at a rate of 5 Å/s which produces the highest VOCand ISC. The grid width and grid spacing has been optimized experimentally to be 7 and 100 µm, respectively. Under AM1 light intensity, the best cell shows a conversion efficiency of 10.41 percent (total area), short-circuit current density of 32.8 mA/cm2, and open-circuit voltage of 0.544 V.
Keywords :
Current density; Fabrication; Grain boundaries; Optical films; Photovoltaic cells; Potential energy; Schottky diodes; Surface morphology; Surface treatment; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.22003
Filename :
1484749
Link To Document :
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