• DocumentCode
    1099531
  • Title

    Comments on "Analysis of photocurrent decay (PCD) method for measuring minority-carrier lifetime in solar cells"

  • Author

    Harrett, T.

  • Author_Institution
    STC Components Limited, Paignton, England
  • Volume
    32
  • Issue
    3
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    725
  • Lastpage
    726
  • Abstract
    The three-dimensional photocurrent decay analysis in the above paper has been extended in the case of the thick cell. The resulting expression has been solved numerically to obtain a set of curves relating the minority-carrier lifetime τ with the decay time t (both normalized with respect to (a^{2}D)^{-1} , where a and D are the optical absorption and minority-carrier diffusion coefficients, respectively) for a wide range of current decay ratios.
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.22009
  • Filename
    1484755