DocumentCode :
1100315
Title :
An 8-Bit Flash Analog-to-Digital Converter in Standard CMOS Technology Functional From 4.2 K to 300 K
Author :
Creten, Ybe ; Merken, Patrick ; Sansen, Willy ; Mertens, Robert P. ; Van Hoof, Chris
Author_Institution :
IMEC, Leuven
Volume :
44
Issue :
7
fYear :
2009
fDate :
7/1/2009 12:00:00 AM
Firstpage :
2019
Lastpage :
2025
Abstract :
This paper presents the first flash Analog-to-Digital Converter (ADC) in standard CMOS technology that functions from 300 K (room temperature) down to 4.2 K. It has been designed to operate in cryogenic sensor systems as they are cooled from room temperature to their final cryogenic operating temperature. In order to preserve the circuit´s performance over this wide temperature range, even in the presence of temperature-induced transistor anomalies, dedicated architecture and switching schemes are employed. SPICE models for adequate circuit simulation at 4.2 K have been extracted. A first prototype of the chosen architecture, an 8-bit ADC in a standard 0.7 mum CMOS technology, achieves a differential nonlinearity (DNL) of 0.5 LSB at room temperature and 1 LSB at 4.2 K at a sampling frequency of 12.5 kHz.
Keywords :
CMOS digital integrated circuits; SPICE; analogue-digital conversion; cryogenic electronics; temperature sensors; SPICE model; cryogenic operating temperature; cryogenic sensor system; differential nonlinearity; flash analog-to-digital converter; frequency 12.5 kHz; size 0.7 mum; standard CMOS technology; temperature 4.2 K to 300 K; word length 8 bit; Analog-digital conversion; CMOS technology; Circuit optimization; Cryogenics; SPICE; Semiconductor device modeling; Sensor systems; Switching circuits; Temperature distribution; Temperature sensors; Cryogenic ADC; LHT; cryogenic CMOS; cryogenic electronics; low-temperature electronics;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2009.2021918
Filename :
5109798
Link To Document :
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