DocumentCode :
1100399
Title :
A GaAs 1-kbit static RAM with a shallow recessed-gate structure FET
Author :
Takano, Satoshi ; Tanino, Noriyuki ; Yoshihara, Tsutomu ; Mitsui, Yasuo ; Nishitani, Kazuo
Author_Institution :
Mitsubishi Electric Corporation, Hyogo, Japan
Volume :
32
Issue :
6
fYear :
1985
fDate :
6/1/1985 12:00:00 AM
Firstpage :
1135
Lastpage :
1139
Abstract :
A novel GaAs FET structure, the shallow recessed-gate structure, has been proposed and applied to a 1-kbit static RAM. In order to decrease the source resistance Rsand gate capacitance Cg, the shallow n+implanted layer was formed between the gate and source/drain region; then the gate region was slightly recessed. This FET has a high transconductance gm, low source resistance Rs, small gate capacitance Cg, and small deviation of threshold voltage \\partial V_{th} , and thus is suitable for high-speed GaAs LSI\´s. A 1-kbit static RAM has been designed and fabricated applying this FET structure and an access time of 3.8 ns with 38- mW power dissipation has been obtained.
Keywords :
Circuits; Electrodes; FETs; Gallium arsenide; Large scale integration; Parasitic capacitance; Power dissipation; Read-write memory; Surface resistance; Threshold voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.22086
Filename :
1484832
Link To Document :
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