DocumentCode
1100431
Title
Power, Thermal, and Reliability Modeling in Nanometer-Scale Microprocessors
Author
Brooks, David ; Dick, Robert P. ; Joseph, Russ ; Shang, Li
Author_Institution
Harvard Univ., Cambridge
Volume
27
Issue
3
fYear
2007
Firstpage
49
Lastpage
62
Abstract
System integration and performance requirements are dramatically increasing the power consumptions and power densities of high-performance microprocessors. High power consumption introduces challenges to various aspects of microprocessor and computer system design. It increases the cost of cooling and packaging design, reduces system reliability, complicates power supply circuitry design, and reduces battery life. Researchers have recently dedicated intensive effort to power-related design problems. Modeling is the essential first step toward design optimization. In this article, the power, thermal and reliability modeling problems are explained and recent advances in their accurate and efficient analysis are surveyed.
Keywords
circuit reliability; low-power electronics; microprocessor chips; nanostructured materials; thermal management (packaging); microprocessor design; power model; reliability model; thermal model; modeling of computer architecture; power models; process variation; reliability models; thermal analysis;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/MM.2007.58
Filename
4292056
Link To Document