The purpose of this paper is the characterization of Hg
0.3Cd
0.7Te avalanche photodiodes at γ = 1.3 µm. These devices are manufactured by tile Société Anonyme des Télécommunications. The multiplication noise for these APD\´s is measured. The value of the ratio

= β/α is deduced from noise measurements, β and α being, respectively, the hole and electron ionization coefficients. It is shown that these HgCdTe APD\´s are promising candidates for detectors of 1.3-µm optical communication.