DocumentCode
1100807
Title
Digital image processing test patterns
Author
Thong, Tran
Author_Institution
Tektronix Laboratories, Tektronix, Inc., Beaverton, OR
Volume
31
Issue
3
fYear
1983
fDate
6/1/1983 12:00:00 AM
Firstpage
763
Lastpage
766
Abstract
An easily generated test pattern is proposed. This digital test pattern is based on a linearly swept frequency modulated signal, thus the effects of an algorithm on the test pattern can be related to the two-dimensional frequency characteristics of the algorithm under test. The test pattern can be used to give a check of the algorithm frequency response along with providing aliasing information, such as which frequencies are aliased, and where they are aliased to.
Keywords
Bandwidth; Chirp modulation; Circuit testing; Digital images; Digital modulation; Displays; Frequency modulation; Signal processing algorithms; TV; Test pattern generators;
fLanguage
English
Journal_Title
Acoustics, Speech and Signal Processing, IEEE Transactions on
Publisher
ieee
ISSN
0096-3518
Type
jour
DOI
10.1109/TASSP.1983.1164089
Filename
1164089
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