• DocumentCode
    1100875
  • Title

    Low-threshold quantum well lasers grown by metalorganic chemical vapor deposition on nonplanar substrates

  • Author

    Dzurko, Kenneth M. ; Menu, Eric P. ; Beyler, Christopher A. ; Osinski, Julian S. ; Dapkus, P.Daniel

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    25
  • Issue
    6
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    1450
  • Lastpage
    1458
  • Abstract
    Low-threshold quantum-well lasers having as-grown optical and electronic confinement fabricated by a single-step growth on nonplanar substrates are discussed. Several devices using various approaches for delineating narrow active regions by this technique are described. Fully planar index-guided arrays grown over a nonplanar substrate exhibit a threshold current of 8 mA per element. A technology called temperature engineered growth, which permits the formation of submicrometer active-region widths and wide contacting regions in the same growth step, is introduced. Lasers having active regions as narrow as 0.5 μm grown using this technology display stable single-transverse-mode operation. CW threshold currents as low as 2.5 mA at room temperature with differential quantum efficiencies of 34%/facet were measured for uncoated devices
  • Keywords
    chemical vapour deposition; semiconductor growth; semiconductor junction lasers; 19 to 25 degC; 2.5 mA; 8 mA; differential quantum efficiencies; low-threshold quantum well lasers; metalorganic chemical vapor deposition; narrow active regions; nonplanar substrates; planar index-guided arrays; stable single-transverse-mode operation; temperature engineered growth; Chemical lasers; Chemical vapor deposition; Current measurement; Displays; Etching; Laser modes; Laser stability; MOCVD; Optical arrays; Optical computing; Quantum well lasers; Temperature; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.29280
  • Filename
    29280