DocumentCode :
1101075
Title :
A 1/2-in. CCD image sensor overlaid with a hydrogenated amorphous silicon
Author :
Chikamura, Takao ; Komeda, Tadao ; Ishiko, Daisuke ; Yoshino, Masaru ; Nakayama, Mitsuo ; Yano, Kousaku ; Aoki, Yoshitaka ; Ueno, Atsushi ; Yamada, Takahiro ; Ishihara, Takeshi
Author_Institution :
Matsushita Electric Industrial Co., Ltd., Osaka, Japan
Volume :
32
Issue :
8
fYear :
1985
fDate :
8/1/1985 12:00:00 AM
Firstpage :
1495
Lastpage :
1498
Abstract :
A half-inch size CCD image sensor overlaid with a hydrogen-erated amorphous silicon (α-Si:H) as a photodetector has been developed. The array consists of 506V × 404H picture elements. The glow-discharged α-Si:H film has high quantum efficiency of 0.75-0.8 in the visible wavelength range and low dark current of 0.2 nA/cm2and is formed on the CCD scanner with vertical overflow drain. This CCD image sensor has a sensitivity of 0.014 µA/lx (3200 K)and a S/N ratio of 73 and 68 dB for fixed-pattern noise and random noise, respectively. Smearing signal is suppressed to below 5 percent at incident light intensity of 1000 times saturation exposure. The blooming and highlight lag are completely suppressed by the vertical overflow drain structure.
Keywords :
Amorphous silicon; Cameras; Charge coupled devices; Charge-coupled image sensors; Dark current; Image sensors; Photoconductivity; Photodetectors; Signal to noise ratio; Solid state circuits;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.22152
Filename :
1484898
Link To Document :
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