DocumentCode :
1101092
Title :
Image flicker control by CCD-chip-shift and wobble operation at double-enhanced Nyquist regions
Author :
Yoshida, Okia ; Endo, Yukio ; Egawa, Yoshitaka ; Harada, Nozomu
Author_Institution :
Toshiba Corporation, Kanagawa, Japan
Volume :
32
Issue :
8
fYear :
1985
fDate :
8/1/1985 12:00:00 AM
Firstpage :
1505
Lastpage :
1510
Abstract :
CCD-chip-shift operation can double the Nyquist limit to give a high-resolution CCD imager. Image flickers, however, are apt to appear at highly resolved images near the double-enhanced Nyquist limit. The flickers are, in nature, field-time-dependent image flickers inherent in the operation principle. In order to suppress image flickers, a CCD-chip wobbling was superimposed at swung sites for the CCD-chip-shift imager by utilizing piezoelectric bimorph acutators, on which the CCD chip was mounted. By wobbling, apparent horizontal pixel apertures were enlarged to overlap each other, resulting in MTF control at the double-enhanced Nyquist regions.
Keywords :
Actuators; Apertures; Charge coupled devices; Glass; Image resolution; Packaging; Pixel; Senior members; Solid state circuits; Transfer functions;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.22154
Filename :
1484900
Link To Document :
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