• DocumentCode
    1101092
  • Title

    Image flicker control by CCD-chip-shift and wobble operation at double-enhanced Nyquist regions

  • Author

    Yoshida, Okia ; Endo, Yukio ; Egawa, Yoshitaka ; Harada, Nozomu

  • Author_Institution
    Toshiba Corporation, Kanagawa, Japan
  • Volume
    32
  • Issue
    8
  • fYear
    1985
  • fDate
    8/1/1985 12:00:00 AM
  • Firstpage
    1505
  • Lastpage
    1510
  • Abstract
    CCD-chip-shift operation can double the Nyquist limit to give a high-resolution CCD imager. Image flickers, however, are apt to appear at highly resolved images near the double-enhanced Nyquist limit. The flickers are, in nature, field-time-dependent image flickers inherent in the operation principle. In order to suppress image flickers, a CCD-chip wobbling was superimposed at swung sites for the CCD-chip-shift imager by utilizing piezoelectric bimorph acutators, on which the CCD chip was mounted. By wobbling, apparent horizontal pixel apertures were enlarged to overlap each other, resulting in MTF control at the double-enhanced Nyquist regions.
  • Keywords
    Actuators; Apertures; Charge coupled devices; Glass; Image resolution; Packaging; Pixel; Senior members; Solid state circuits; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.22154
  • Filename
    1484900