DocumentCode
1101092
Title
Image flicker control by CCD-chip-shift and wobble operation at double-enhanced Nyquist regions
Author
Yoshida, Okia ; Endo, Yukio ; Egawa, Yoshitaka ; Harada, Nozomu
Author_Institution
Toshiba Corporation, Kanagawa, Japan
Volume
32
Issue
8
fYear
1985
fDate
8/1/1985 12:00:00 AM
Firstpage
1505
Lastpage
1510
Abstract
CCD-chip-shift operation can double the Nyquist limit to give a high-resolution CCD imager. Image flickers, however, are apt to appear at highly resolved images near the double-enhanced Nyquist limit. The flickers are, in nature, field-time-dependent image flickers inherent in the operation principle. In order to suppress image flickers, a CCD-chip wobbling was superimposed at swung sites for the CCD-chip-shift imager by utilizing piezoelectric bimorph acutators, on which the CCD chip was mounted. By wobbling, apparent horizontal pixel apertures were enlarged to overlap each other, resulting in MTF control at the double-enhanced Nyquist regions.
Keywords
Actuators; Apertures; Charge coupled devices; Glass; Image resolution; Packaging; Pixel; Senior members; Solid state circuits; Transfer functions;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1985.22154
Filename
1484900
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