DocumentCode :
110113
Title :
Measurement of UV from a Microplasma by a Microfabricated Amorphous Selenium Detector
Author :
Abbaszadeh, Shiva ; Karim, K.S. ; Karanassios, V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
Volume :
60
Issue :
2
fYear :
2013
fDate :
Feb. 2013
Firstpage :
880
Lastpage :
883
Abstract :
We spectrally demonstrate for the first time that an amorphous selenium metal-semiconductor-metal detector can be used for the measurement of ultraviolet photons (200-400 nm) generated from a portable battery-operated microplasma that is used as a light source. An advantage of this low-cost detector is that the device structure allows photons to strike the light-sensitive layer directly rather than through electrodes or blocking layers. Another advantage is that despite operation at high electric fields of up to 43 V/μm, the dark current of the detector at room temperature is 3 pA/mm2. Therefore, detector cooling is not required, and this facilitates portability for measurements on-site (i.e., in the field and away from a laboratory). Spectral response was monitored using a scanning monochromator, and it was compared with that obtained by a portable spectrometer fitted with a linear charge-coupled device detector. To demonstrate detector responsivity, emission signals with an appreciable signal-to-noise ratio were obtained by introducing nanogram amounts of the sample into the microplasma.
Keywords :
metal-semiconductor-metal structures; photons; selenium; ultraviolet detectors; Se; UV measurement; amorphous selenium metal-semiconductor-metal detector; detector dark current; detector responsivity; emission signals; light source; light-sensitive layer; linear charge-coupled device detector; measurement on-site portability; microfabricated amorphous selenium detector; nanogram amounts; portable battery-operated microplasma; portable spectrometer; scanning monochromator; signal-to-noise ratio; spectral response; ultraviolet photon measurement; Dark current; Detectors; Educational institutions; Electrodes; Photonic band gap; Semiconductor device measurement; Signal to noise ratio; Amorphous selenium (a-Se); metal–semiconductor–metal detector; microplasma; ultraviolet (UV) detector;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2231682
Filename :
6399582
Link To Document :
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