DocumentCode
110127
Title
Improvement of High-Value Capacitance Measurement
Author
Dai Dongxue ; He Xiaobing ; Wang Wei ; Li Yanqiang
Author_Institution
Nat. Inst. of Metrol., Beijing, China
Volume
62
Issue
6
fYear
2013
fDate
Jun-13
Firstpage
1795
Lastpage
1800
Abstract
An improved method of measuring high-value capacitors based on sampling technology is presented in this letter. A standard resistor is used as reference at its resistance and time constant. An inductive shunt is used to produce two precisely equal currents in parallel so that the capacitor and the resistor can be measured at ground potential. The calibration procedure for the inductive shunt, the measured results, and their uncertainty are reported for 10 mmbμF, 100 mmbμF, and 1 mF at frequencies of 100 Hz, 120 Hz and 1 kHz.
Keywords
calibration; capacitance measurement; capacitors; electric resistance measurement; measurement uncertainty; resistors; sampling methods; calibration; capacitance 1 mF; capacitance 10 muF; capacitance 100 muF; frequency 1 kHz; frequency 100 Hz; frequency 120 Hz; high-value capacitance measurement; high-value capacitors; inductive shunt; measurement uncertainty; sampling technology; standard resistor; time constant; Capacitors; inductive shunt; measurement; sampling methods; uncertainty;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2013.2250191
Filename
6488846
Link To Document