Title :
Improvement of High-Value Capacitance Measurement
Author :
Dai Dongxue ; He Xiaobing ; Wang Wei ; Li Yanqiang
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
Abstract :
An improved method of measuring high-value capacitors based on sampling technology is presented in this letter. A standard resistor is used as reference at its resistance and time constant. An inductive shunt is used to produce two precisely equal currents in parallel so that the capacitor and the resistor can be measured at ground potential. The calibration procedure for the inductive shunt, the measured results, and their uncertainty are reported for 10 mmbμF, 100 mmbμF, and 1 mF at frequencies of 100 Hz, 120 Hz and 1 kHz.
Keywords :
calibration; capacitance measurement; capacitors; electric resistance measurement; measurement uncertainty; resistors; sampling methods; calibration; capacitance 1 mF; capacitance 10 muF; capacitance 100 muF; frequency 1 kHz; frequency 100 Hz; frequency 120 Hz; high-value capacitance measurement; high-value capacitors; inductive shunt; measurement uncertainty; sampling technology; standard resistor; time constant; Capacitors; inductive shunt; measurement; sampling methods; uncertainty;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2013.2250191
