Title :
Determination of surface- and bulk-generation parameters from dark-current measurements in surface-channel CCD´s
Author :
Chik, Dawkung K. ; Kriegler, Rudolph J. ; Devenyi, Tibor F.
Author_Institution :
Bell-Northern Research, Ottawa, Ontario, Canada
fDate :
9/1/1985 12:00:00 AM
Abstract :
A technique for determining surface-generation velocity and bulk minority-carrier generation lifetime from measurements in surface-channel charge-coupled devices (SCCD) is described. Depleted surface-generation velocity of 1.1 cm/s and bulk minority-carrier generation lifetime of 130 µs have been determined in the channel region for the devices used, and are in good agreement with data obtained by other techniques.
Keywords :
Charge carriers; Current measurement; DC generators; Electrodes; Electrons; Frequency; Low-frequency noise; MOS capacitors; Signal generators; Velocity measurement;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1985.22176
