Title :
Diagnosis of Single-Gate Failures in Combinational circuits
Author :
Hornbuckle, Gary D. ; Spann, Richard N.
Author_Institution :
IEEE
fDate :
3/1/1969 12:00:00 AM
Abstract :
Two procedures are presented for detecting and diagnosing arbitrary single-gate failures in combinational logic circuits. A gate is defined as any multiple-input single-output combinational circuit, and a failure is any detectable transformation of the correct gate function. The testing procedures do not require the construction of a fault table and will locate, to within an equivalence class, the faulty gate and describe its failure.
Keywords :
Combinational logic, computer failure detection, diagnostic test generation, fault diagnosis, single-gate failures.; Application software; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault diagnosis; Fault location; Laboratories; Logic testing; Combinational logic, computer failure detection, diagnostic test generation, fault diagnosis, single-gate failures.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1969.222634
