• DocumentCode
    1101945
  • Title

    A BiCMOS time interval digitizer based on fully-differential, current-steering circuits

  • Author

    Loinaz, Marc J. ; Wooley, Bruce A.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • Volume
    29
  • Issue
    6
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    707
  • Lastpage
    714
  • Abstract
    A time interval digitizer cell with a 0-16 ns input range and a nominal LSB width of 1.0 ns has been integrated in a 2-μm BiCMOS technology, The circuit exhibits both integral and differential nonlinearity below 0.15 LSB and a timing error of 0.32 ns RMS. Logic gate propagation delays are used as time measurement units, and the nominal value of the delays is set by an on-chip phase-locked loop (PLL). Fully-differential, current-steering circuits with low voltage swings are used to implement the time interval digitizer so as to generate minimal switching noise. The cell is to be used in the monolithic, multi-channel realization of a high-sensitivity, mixed-signal data acquisition front-end. By virtue of the time digitization architecture used, the average power dissipation of the cell is only 19.8 mW, despite the use of circuits that dissipate static power, and the layout area is a compact 448 μm×634 μm
  • Keywords
    BiCMOS integrated circuits; analogue-digital conversion; data acquisition; phase-locked loops; time measurement; 0 to 16 ns; 19.8 mW; 2 mum; 2-μm BiCMOS technology; 448 mum; 634 mum; BiCMOS time interval digitizer; average power dissipation; current-steering circuits; differential nonlinearity; fully-differential; high-sensitivity; input range; integral nonlinearity; layout area; logic gate propagation delays; low voltage swings; minimal switching noise; mixed-signal data acquisition front-end; multi-channel realization; nominal LSB width; on-chip phase-locked loop; static power; time digitization architecture; time interval digitizer cell; time measurement units; timing error; BiCMOS integrated circuits; Delay effects; Integrated circuit technology; Logic gates; Low voltage; Phase locked loops; Propagation delay; Switching circuits; Time measurement; Timing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.293117
  • Filename
    293117