Title :
Flux creep in cation deficient Bi2(Sr,Ca)3Cu 2O8+d
Author :
Nomura, Shunji ; Chiang, Yet-ming
Author_Institution :
Dept. of Mater. Sci. & Eng., MIT, Cambridge, MA, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
Flux pinning in Bi2(Sr,Ca)3-xCu2O 8+d was investigated as a function of cation deficiency and thermal history. A comparison of polycrystalline samples of cation stoichiometric and highly alkaline earth deficient composition (x =0.3) shows a marked difference in the magnetization hysteresis (ΔM) and time-dependent decay of magnetization at temperatures below 40 K. The pinning energy (95-140 meV at 10-20 K) derived from flux creep data for an x=0.3 cation-deficient composition is 4-7 times greater than that for a stoichiometric composition. The difference in ΔM between stoichiometric and nonstoichiometric compositions increases with increasing field out to 5.5 T and is greatest at 20 K, but still significant at 40 K. The intragranular Jc of an x=0.3 composition exceeds that of the stoichiometric by >102 at a field of 1 T. The dependence of pinning characteristics in cation-deficient samples on thermal history suggests that defect clustering or incipient precipitation plays an important role in improving pinning
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); flux creep; flux pinning; heat treatment; high-temperature superconductors; magnetic hysteresis; magnetisation; stoichiometry; strontium compounds; 0 to 40 K; Bi2(SrCa)3Cu2O8+d; cation deficiency; defect clustering; flux creep; flux pinning; high temperature superconductivity; incipient precipitation; intragranular Jc; magnetization hysteresis; nonstoichiometric compositions; pinning characteristics; pinning energy; polycrystalline samples; stoichiometric composition; thermal history; time dependent magnetisation decay; Bismuth; Creep; Critical current density; Magnetic field measurement; Magnetization; Nitrogen; Plasma measurements; Plasma temperature; Powders; Strontium;
Journal_Title :
Magnetics, IEEE Transactions on