DocumentCode :
1102180
Title :
Effects of Measurement Devices on Conducted Interference Levels
Author :
Malack, J.A. ; Nicholson, J.R.
Author_Institution :
Systems Products Division, IBM Corporation, Endicott, N.Y. 13760
Issue :
2
fYear :
1973
fDate :
5/1/1973 12:00:00 AM
Firstpage :
61
Lastpage :
65
Abstract :
Measurements of power line conducted interference voltages are commonly made throughout the 150 kHz to 30 MHz frequency range on military, industrial, and consumer equipment using line impedance stabilization networks (LISN) and, more recently, current probe techniques. This paper presents some brief background information concerning power line conducted interference measurements and the results of a study to assess the effects of LISN and current probe measurement devices on the level of measured conducted interference. A model is defined which facilitates prediction of the effects. The model concept allows the procedures described in this paper to be extended to equipment of other impedance definitions. A comparison of the calculated and empirical differences is made and suggests an analytical approach in sizing the effects upon the conducted interference levels.
Keywords :
Current measurement; Defense industry; Frequency measurement; Impedance measurement; Interference; Military equipment; Power measurement; Predictive models; Probes; Voltage;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.1973.303249
Filename :
4090730
Link To Document :
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