• DocumentCode
    1102280
  • Title

    Theory of electron and hole impact ionization in quantum well and staircase superlattice avalanche photodiode structures

  • Author

    Brennan, Kevin

  • Author_Institution
    Georgia Institute of Technology, Atlanta, GA
  • Volume
    32
  • Issue
    11
  • fYear
    1985
  • fDate
    11/1/1985 12:00:00 AM
  • Firstpage
    2197
  • Lastpage
    2205
  • Abstract
    An ensemble many particle Monte Carlo simulation of both electron and hole impact ionization superlattice avalanche photodiodes is presented. The effects of the well depth, width, and applied electric field are analyzed for both the electrons and holes in the quantum well structure. The results are consistent with the current theory of impact ionization first proposed by Shichijo and Hess. It is found that the ratio of the electron to hole impact ionization rates is roughly two orders of magnitude in the staircase APD while α/β is enhanced by one order of magnitude in the quantum well device.
  • Keywords
    Avalanche photodiodes; Charge carrier processes; Conducting materials; Electrons; Gallium arsenide; Impact ionization; Kinetic energy; Lattices; Quantum mechanics; Superlattices;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.22258
  • Filename
    1485004