• DocumentCode
    1102436
  • Title

    Ripple structures associated with ordered surface defects in dielectrics

  • Author

    Soileau, M.J.

  • Author_Institution
    North Texas State University, Denton, TX, USA
  • Volume
    20
  • Issue
    5
  • fYear
    1984
  • fDate
    5/1/1984 12:00:00 AM
  • Firstpage
    464
  • Lastpage
    467
  • Abstract
    Laser-induced ripple structures on material surfaces have been observed by a number of workers for various materials including metals, semiconductors, and dielectrics. A model has been proposed [1] which correctly accounts for the spacing and polarization dependence of the ripples, and the association of the ripples with material defects. In this letter, experimental results which unambiguously show the association of these features with defects are presented. Quantitative measurements of laser-induced damage thresholds show a reduction of damage thresholds for surfaces with controlled linear defects aligned orthogonal to the incident laser field (as predicted in [1]).
  • Keywords
    Dielectric radiation effects; Laser radiation effects; Dielectric materials; Dielectric measurements; Inorganic materials; Laser modes; Optical control; Optical materials; Polarization; Semiconductor lasers; Semiconductor materials; Surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1984.1072422
  • Filename
    1072422