DocumentCode
1102436
Title
Ripple structures associated with ordered surface defects in dielectrics
Author
Soileau, M.J.
Author_Institution
North Texas State University, Denton, TX, USA
Volume
20
Issue
5
fYear
1984
fDate
5/1/1984 12:00:00 AM
Firstpage
464
Lastpage
467
Abstract
Laser-induced ripple structures on material surfaces have been observed by a number of workers for various materials including metals, semiconductors, and dielectrics. A model has been proposed [1] which correctly accounts for the spacing and polarization dependence of the ripples, and the association of the ripples with material defects. In this letter, experimental results which unambiguously show the association of these features with defects are presented. Quantitative measurements of laser-induced damage thresholds show a reduction of damage thresholds for surfaces with controlled linear defects aligned orthogonal to the incident laser field (as predicted in [1]).
Keywords
Dielectric radiation effects; Laser radiation effects; Dielectric materials; Dielectric measurements; Inorganic materials; Laser modes; Optical control; Optical materials; Polarization; Semiconductor lasers; Semiconductor materials; Surface emitting lasers;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1984.1072422
Filename
1072422
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