• DocumentCode
    1102576
  • Title

    Thermal and Mechanical Analysis of High-Power LEDs With Ceramic Packages

  • Author

    Hu, Jianzheng ; Yang, Lianqiao ; Shin, Moo Whan

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Myongji Univ., Yongin
  • Volume
    8
  • Issue
    2
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    297
  • Lastpage
    303
  • Abstract
    In this paper, we present the thermal and mechanical analysis of high-power light-emitting diodes (LEDs) with ceramic packages. Transient thermal measurements and thermomechanical simulations were performed to study the thermal and mechanical characteristics of ceramic packages. Thermal resistances from the junction to the ambient were decreased from 79.6 to 46.7degC/W by replacing the plastic mold with a ceramic mold for LED packages. Thermomechanical stress induced in the heat-block test was simulated using a finite-element method. Higher level of thermomechanical stress in the chip was found for LEDs with ceramic packages, despite less mismatching coefficients of thermal expansion, compared with that with plastic packages. The thermomechanical-stress components in the direction of the thickness were found to be larger than that in other two directions. The results suggest that the thermal performance of LEDs can be improved by using ceramic packages, but the mounting process of the high-power LEDs with ceramic packages is critically important and should be the reason for causing delaminating interface layers in the packages.
  • Keywords
    ceramic packaging; finite element analysis; light emitting diodes; thermal analysis; thermal expansion; thermal resistance; ceramic packages; delaminating interface layers; finite-element method; heat-block test; high-power LED; light-emitting diodes; mechanical analysis; mounting process; plastic mold; plastic packages; thermal analysis; thermal expansion coefficients; thermal resistances; thermomechanical simulations; transient thermal measurements; Light-emitting diode (LED); light emitting diode; packaging; thermal measurement; thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2008.920298
  • Filename
    4472167