DocumentCode

1103079

Title

IIIB-1 Performance deviation of submicrometer MOSFET´s from scaling laws

Author

Kume, Hideyuki ; Igura, Y. ; Kaga, T. ; Hagiwara, Tomomichi

Volume

32

Issue

11

fYear

1985

fDate

11/1/1985 12:00:00 AM

Firstpage

2536

Lastpage

2536

Keywords

Delay effects; Delay estimation; Electrons; Laboratories; Performance evaluation; Power measurement; Power supplies; Solid state circuits; Voltage; Writing;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1985.22331

Filename

1485077