Title :
IIIB-2 Channel length characterization of LDD MOSFET´s
Author :
Sun, J.Y.C. ; Wordeman, M.R. ; Laux, S.E.
fDate :
11/1/1985 12:00:00 AM
Keywords :
Algorithm design and analysis; Analytical models; Data mining; Electrons; Error analysis; Geometry; MOSFET circuits; Solid modeling; Solid state circuits; Sun;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1985.22332
