Title :
IIIB-4 one-dimensional conductivity in multiple parallel inversion lines
Author :
Warren, A.C. ; Antoniadis, Dimitri A. ; Smith, Henry I ; Melngailis, J.
fDate :
11/1/1985 12:00:00 AM
Keywords :
Bridges; Conductivity; Conductors; Contact resistance; Density measurement; Fluctuations; Gratings; MOSFET circuits; Silicon; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1985.22333
