• DocumentCode
    1103220
  • Title

    Surface impedance measurements and calculations according to the Mattis-Bardeen theory on high-Tc superconductors

  • Author

    Kataria, N.D. ; Popel, R. ; Wolf, H. ; Sachse, H. ; Kuhlemann, T. ; Niemeyer, J.

  • Author_Institution
    Physikalisch-Tech. Bundesanstalt, Braunschweig, West Germany
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    1302
  • Lastpage
    1305
  • Abstract
    Surface impedance measurements made on YBa2Cu3 O7-x (YBCO) films are reported and compared with the exact solution of the Mattis-Bardeen theory applied to strong-coupling superconductors. Epitaxial films of YBCO were grown by the coevaporation of Y, BaF2, and Cu and ex-situ wet O2 annealing. The films were deposited at substrate temperatures ranging from 200°C to 820°C. X-ray diffraction shows that the films grown in the temperature range 720°C-780°C are epitaxial with the c -axis perpendicular to the substrate surface. Surface impedances of the samples were measured using a cylindrical copper cavity at 66.8 GHz. It is demonstrated that the value of the surface resistance can be considerably reduced on c-axis-oriented epitaxial films with correlated a-b orientation across the whole surface of the film. The calculation of the surface resistance using the Mattis-Bardeen theory is found to explain the experimental behavior with Bardeen-Cooper-Schrieffer (BCS) energy gap value
  • Keywords
    barium compounds; high-temperature superconductors; superconducting epitaxial layers; superconducting thin films; surface conductivity; yttrium compounds; 66.8 GHz; Mattis-Bardeen theory; X-ray diffraction; YBa2Cu3O7-x; epitaxial; films; high temperature superconductor; surface resistance; Annealing; Impedance measurement; Substrates; Superconducting films; Superconductivity; Surface impedance; Surface resistance; Temperature distribution; X-ray diffraction; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133423
  • Filename
    133423