• DocumentCode
    1103245
  • Title

    Microwave surface impedance in a coaxial cavity as a material characterisation technique

  • Author

    Gallop, J.C. ; Radcliffe, W.J. ; Button, T.W. ; Alford, N. McN

  • Author_Institution
    NPL, Teddington, UK
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    1310
  • Lastpage
    1312
  • Abstract
    Measurements of the surface resistance Rs of a number of modes of a coaxial cavity for which the center conductor is a BiSrCaCuO (BSCCO) rod have been made. Results for Rs(T) have allowed a quantitative estimate to be made of the proportions of two different phases present in this material. The variation of Rs(T) with applied DC magnetic field has also been measured for fields below about 1 mT. The results are interpreted in terms of two simple models for microwave loss in bulk high-temperature superconductors. It is concluded that the measurement of microwave surface impedance for high-temperature superconducting specimens can be used to make quantitative estimates of the proportions of various discrete superconducting phases, provided each has a distinguishably different Tc. The apparent concentration at the surface of the high-Tc phase, believed to be Bi2Sr2Ca2Cu3O10, has not been previously reported and may have significance for applications of these materials
  • Keywords
    bismuth compounds; calcium compounds; high-temperature superconductors; strontium compounds; surface conductivity; Bi2Sr2Ca2Cu3O10 ; BiSrCaCuO; applied DC magnetic field; coaxial cavity; high temperature superconductor; material characterisation technique; microwave loss; microwave surface impedance; surface resistance; Bismuth compounds; Coaxial components; Conducting materials; Electrical resistance measurement; High temperature superconductors; Magnetic field measurement; Phase estimation; Superconducting microwave devices; Surface impedance; Surface resistance;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133425
  • Filename
    133425