Title :
IVB-7 low-frequency noise and DLTS semiconductor device characterization
Author :
Scholz, F. ; Hwang, J.M. ; Schroder, Dieter K.
fDate :
11/1/1985 12:00:00 AM
Keywords :
Electron devices; Low-frequency noise; Noise measurement; Semiconductor device measurement; Semiconductor device noise; Semiconductor devices; Semiconductor impurities; System performance; Telecommunications; Time measurement;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1985.22352
