• DocumentCode
    1103312
  • Title

    IVB-7 low-frequency noise and DLTS semiconductor device characterization

  • Author

    Scholz, F. ; Hwang, J.M. ; Schroder, Dieter K.

  • Volume
    32
  • Issue
    11
  • fYear
    1985
  • fDate
    11/1/1985 12:00:00 AM
  • Firstpage
    2544
  • Lastpage
    2544
  • Keywords
    Electron devices; Low-frequency noise; Noise measurement; Semiconductor device measurement; Semiconductor device noise; Semiconductor devices; Semiconductor impurities; System performance; Telecommunications; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.22352
  • Filename
    1485098
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1103312