• DocumentCode
    1103328
  • Title

    Experimental analysis of superconducting properties of Y-Ba-Cu-O/Ag proximity interfaces

  • Author

    Fujimaki, A. ; Takai, Y. ; Hayakawa, H.

  • Author_Institution
    Dept. of Electron., Nagoya Univ., Japan
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    1353
  • Lastpage
    1356
  • Abstract
    The electrical properties of YBa2Cu3O7-y/Ag proximity interfaces are reported. In order to study these properties, SNS (superconductor/normal metal/superconductor) junctions made of YBa2Cu3O 7-y/Ag/Nb thin films and SNIS (superconductor/normal metal/insulator/superconductor) junctions made of YBa2Cu3O7-y/Ag/AlOx/Nb thin films were examined. Experimental results on the SNS junctions imply that weak links are formed inside YBa2Cu3O7-y and that the junction properties depend on the area of the surface nonsuperconducting phases. The Jc-R n relationship and the Rn-T characteristics suggest the presence of nonsuperconducting phases grown partially on the YBa2Cu3O7-y surfaces. The results on the SNIS junctions show little superconductivity induced in the Ag layers by the YBa2Cu3O7-y films
  • Keywords
    aluminium compounds; barium compounds; electronic conduction in insulating thin films; high-temperature superconductors; niobium; proximity effect; silver; superconducting junction devices; type II superconductors; yttrium compounds; Jc-Rn relationship; Rn-T characteristics; YBa2Cu3O7-y-Ag-AlOx -Nb; YBa2Cu3O7-y-Ag-Nb; electrical properties; high temperature superconductors; proximity interfaces; superconducting properties; surface nonsuperconducting phases; type II superconductors; weak links; Conducting materials; Conductive films; High temperature superconductors; Niobium; Proximity effect; Superconducting devices; Superconducting films; Superconducting thin films; Superconductivity; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133434
  • Filename
    133434