DocumentCode :
1103421
Title :
PCIM: a physically based continuous short-channel IGFET model for circuit simulation
Author :
Arora, Narain D. ; Rios, Rafael ; Huang, Cheng-Liang ; Raol, Kartik
Author_Institution :
Digital Equipment Corp., Hudson, MA, USA
Volume :
41
Issue :
6
fYear :
1994
fDate :
6/1/1994 12:00:00 AM
Firstpage :
988
Lastpage :
997
Abstract :
We present an accurate analytical IGFET model (PCIM), for short-channel devices down to sub-half micron channel lengths. The model is described by a single drain current equation, valid for both weak and strong inversion regions of device operation. The model contains a new velocity-field (υ-ε) relation for carriers in the channel region. Combining this relation with the channel length modulation expression, obtained using engineering approximations to the two-dimensional fields near the drain end in saturation, results in an accurate drain conductance equation. The value for the carrier saturated velocity extracted from the I-V data for different CMOS technologies is 7-8×106 cm/s for electrons and 5-6×106 cm/s for holes, consistent with the reported values. The model not only predicts accurate output conductance, which is important for analog design, but also accurately simulates intrinsic gate capacitances for short channel devices. Since the model is inherently continuous, device conductances and capacitances are smooth and continuous at the transition points. This continuity results in enhanced convergence properties of the circuit simulator SPICE. Because the model is physically based, the temperature dependence of device characteristics in the temperature range 0-120°C can easily be predicted simply by taking the temperature dependence of the threshold voltage, carrier mobility and velocity saturation parameters
Keywords :
SPICE; capacitance; carrier mobility; circuit analysis computing; insulated gate field effect transistors; semiconductor device models; 0 to 120 C; PCIM; SPICE; analog design; carrier mobility; carrier saturated velocity; channel length modulation expression; circuit simulation; convergence properties; drain current equation; intrinsic gate capacitances; output conductance; physically based continuous model; short-channel IGFET model; sub-half micron channel lengths; temperature dependence; threshold voltage; two-dimensional fields; velocity saturation parameters; velocity-field relation; Analytical models; CMOS technology; Capacitance; Charge carrier processes; Circuit simulation; Data mining; Equations; Predictive models; Semiconductor device modeling; Temperature dependence;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.293312
Filename :
293312
Link To Document :
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