• DocumentCode
    1103433
  • Title

    Extension of the Rees basis function technique to simulate nonstationary transport

  • Author

    Khan, Sanjay A. ; Gutmann, Ronald J.

  • Author_Institution
    Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • Volume
    41
  • Issue
    6
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    998
  • Lastpage
    1006
  • Abstract
    Shrinking device geometries have caused considerable interest in accurately modeling nonstationary transport in semiconductors using computationally efficient techniques. In this paper we describe an extension to a basis function technique first proposed by Rees (1973), to model nonstationary effects of electron transport in semiconductors. While the central focus of this paper is to demonstrate and analyze a novel technique to compute a good basis set (based on the “local-effect” and “flux” operations first described by Rees), the Rees technique itself is described in some detail here to serve as the foundation for subsequent arguments. Basis functions computed in this way are not restricted for use in the Rees technique alone-they are also useful in any approach that solves the semi-classical Boltzmann transport equation (BTE) spectrally. However, use of such functions in the Rees spectral technique allows the minimum simulation time-step of the precomputed “transport matrices” to be significantly reduced. Simulation results are presented to demonstrate this improvement in a limited field range
  • Keywords
    Boltzmann equation; functions; semiconductor device models; semiconductors; simulation; Boltzmann transport equation; Rees basis function technique; electron transport; nonstationary transport modelling; semiconductors; simulation; spectral technique; Boltzmann equation; Computational geometry; Computational modeling; Eigenvalues and eigenfunctions; Electrons; Finite difference methods; Monte Carlo methods; Scattering; Solid modeling; Systems engineering and theory;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.293313
  • Filename
    293313